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Three-dimensional shape measurement with binary dithered patterns |
Applied Optics, Vol. 51, Issue 27, pp. 6631-6636 (2012)
http://dx.doi.org/10.1364/AO.51.006631
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Abstract
The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.
© 2012 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: April 23, 2012
Revised Manuscript: August 24, 2012
Manuscript Accepted: August 25, 2012
Published: September 19, 2012
Citation
Yajun Wang and Song Zhang, "Three-dimensional shape measurement with binary dithered patterns," Appl. Opt. 51, 6631-6636 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-27-6631
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