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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 29 — Oct. 10, 2012
  • pp: 6974–6978

Speckle-noise-reduction method of projecting interferometry fringes based on power spectrum density

Liping Zhou, Jianghong Gan, Xiaojun Liu, Long Xu, and Wenlong Lu  »View Author Affiliations


Applied Optics, Vol. 51, Issue 29, pp. 6974-6978 (2012)
http://dx.doi.org/10.1364/AO.51.006974


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Abstract

The fringe projection technique plays an important role in surface inspection, due to its noncontact, full-field acquisition and high resolution. When using projecting interferometry fringes, one of the basic problems encountered is the speckle noise existing in the fringe pattern. In this paper, a novel method is proposed to reduce the speckle noise based on power spectrum density (PSD) thresholding, which consists of three steps: first, PSD is calculated according to the frequency spectrum obtained by Fourier transform; second, a filter is constructed by a PSD thresholding to filter the frequency content of the speckle noise; and finally inverse Fourier transform is used to obtain the noise-reduction image. Experimental results prove the feasibility and effectiveness of the presented method.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 25, 2012
Revised Manuscript: August 16, 2012
Manuscript Accepted: August 25, 2012
Published: October 5, 2012

Citation
Liping Zhou, Jianghong Gan, Xiaojun Liu, Long Xu, and Wenlong Lu, "Speckle-noise-reduction method of projecting interferometry fringes based on power spectrum density," Appl. Opt. 51, 6974-6978 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-29-6974


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