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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 31 — Nov. 1, 2012
  • pp: 7554–7559

Assessment of some experimental and image analysis factors for background-oriented schlieren measurements

Ardian B. Gojani and Shigeru Obayashi  »View Author Affiliations


Applied Optics, Vol. 51, Issue 31, pp. 7554-7559 (2012)
http://dx.doi.org/10.1364/AO.51.007554


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Abstract

Quantitative measurements of fluid flow properties can be achieved by background-oriented schlieren (BOS). In this paper, it is shown that this depends on several factors. Image-quality index is used to investigate the influence of the image sensor and the quality of its output. Image evaluation is applied to synthetic images, which are treated with a step function, so that they simulate the sharp density jump. The gradual change of the evaluated vector shift revealed the major dependence on the interrogation window, and revealed less of a dependence on background features. BOS applied to shock-wave reflection from a wedge in a shock tube gave qualitative results, due to large uncertainties. But, the application to cooling by natural convection gave satisfactory results, comparable to thermocouple data and theory.

© 2012 Optical Society of America

OCIS Codes
(000.3110) General : Instruments, apparatus, and components common to the sciences
(100.2000) Image processing : Digital image processing
(110.2970) Imaging systems : Image detection systems
(100.0118) Image processing : Imaging ultrafast phenomena
(100.4994) Image processing : Pattern recognition, image transforms
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

ToC Category:
Image Processing

History
Original Manuscript: June 7, 2012
Revised Manuscript: September 18, 2012
Manuscript Accepted: October 6, 2012
Published: October 24, 2012

Citation
Ardian B. Gojani and Shigeru Obayashi, "Assessment of some experimental and image analysis factors for background-oriented schlieren measurements," Appl. Opt. 51, 7554-7559 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-31-7554

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