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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 31 — Nov. 1, 2012
  • pp: 7724–7732

Three-dimensional shape measurement of a highly reflected, specular surface with structured light method

Hongwei Zhang, Lishuan Ji, Shugui Liu, Shaohui Li, Shujian Han, and Xiaojie Zhang  »View Author Affiliations


Applied Optics, Vol. 51, Issue 31, pp. 7724-7732 (2012)
http://dx.doi.org/10.1364/AO.51.007724


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Abstract

This paper proposes a mathematical measurement model of a highly reflected, specular surface with structured light method. In the measurement, an auxiliary fringe pattern named amplitude perturbation is adopted to be projected onto the measured surface. The amplitude perturbation can ease the procedure of searching the corresponding points between the phase map of the measured surface and that of the reference plane by locking up the most reliable point as the starting unwrapping point whose true phase can be calculated accurately. The proposed method is also suitable for measuring the step surfaces such as gauge blocks with different heights. Furthermore, the image segmentation technology is introduced in the phase unwrapping procedure to increase the speed. Based on the unwrapped phase map, zonal wave-front reconstruction algorithm is implemented to realize three-dimensional, highly reflected, specular surface reconstruction. Experimental studies show that the developed methodology displays accuracy and high stability for highly reflected, specular surface measurement.

© 2012 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.0150) Machine vision : Machine vision

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 21, 2012
Revised Manuscript: October 7, 2012
Manuscript Accepted: October 8, 2012
Published: November 1, 2012

Citation
Hongwei Zhang, Lishuan Ji, Shugui Liu, Shaohui Li, Shujian Han, and Xiaojie Zhang, "Three-dimensional shape measurement of a highly reflected, specular surface with structured light method," Appl. Opt. 51, 7724-7732 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-31-7724


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