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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 35 — Dec. 10, 2012
  • pp: 8407–8412

Aberration-corrected echelle spectrometer for measuring ultraviolet branching fractions of iron-group ions

Michael P. Wood and James E. Lawler  »View Author Affiliations


Applied Optics, Vol. 51, Issue 35, pp. 8407-8412 (2012)
http://dx.doi.org/10.1364/AO.51.008407


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Abstract

A high-resolution echelle spectrometer with broad wavelength coverage from the UV to the IR and high sensitivity to weak lines is described. Total instrument astigmatism is suppressed through rotation of the order separation system into an orthogonal plane. A suitable choice of mirror angles avoids increased coma. This spectrometer is used to record UV through IR spectra of Fe-group ions to measure improved branching fractions. These new results reduce transition probability uncertainties and yield more accurate derived stellar abundances. Instrument design and performance, including aberration compensation, are presented.

© 2012 Optical Society of America

OCIS Codes
(080.1010) Geometric optics : Aberrations (global)
(300.2140) Spectroscopy : Emission
(300.6190) Spectroscopy : Spectrometers

History
Original Manuscript: September 10, 2012
Revised Manuscript: November 7, 2012
Manuscript Accepted: November 7, 2012
Published: December 6, 2012

Citation
Michael P. Wood and James E. Lawler, "Aberration-corrected echelle spectrometer for measuring ultraviolet branching fractions of iron-group ions," Appl. Opt. 51, 8407-8412 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-35-8407


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