Abstract

A Mueller–Stokes analysis is applied to pure bismuth thin film samples prepared by the laser ablation technique by using a polarimeter with a 632.8 nm continuum wavelength laser. The complex refractive index is determined in the range of 250–1100 nm. Results from the Mueller matrix show the high sensitivity of diattenuation and polarizance parameters as a function of the sample thickness and the incidence angle, except at the pseudo-Brewster angle, where they exhibit the same value. Results show that the knowledge of the polarimetric response, with appropriate incident polarization states, could be used to design photonic Bi-based devices for several applications. Polarization dependence is the result of changes on the surface morphology as a result of the small value of the skin depth.

© 2012 Optical Society of America

Giant nonlinear optical properties of bismuth thin films grown by pulsed laser deposition

D. R. Liu, K. S. Wu, M. F. Shih, and M. Y. Chern
Opt. Lett. 27(17) 1549-1551 (2002)

Laser-induced periodic surface structures on bismuth thin films with ns laser pulses below ablation threshold

A. Reyes-Contreras, M. Camacho-López, S. Camacho-López, O. Olea-Mejía, A. Esparza-García, J. G. Bañuelos-Muñetón, and M. A. Camacho-López
Opt. Mater. Express 7(6) 1777-1786 (2017)

Production and characterization of Ti:sapphire thin films grown by reactive laser ablation with elemental precursors

P. R. Willmott, P. Manoravi, J. R. Huber, T. Greber, Tracey A. Murray, and Keith Holliday
Opt. Lett. 24(22) 1581-1583 (1999)

Fourier analysis near-field polarimetry for measurement of local optical properties of thin films

Lori S. Goldner, Michael J. Fasolka, Sophie Nougier, Hoang-Phi Nguyen, Garnett W. Bryant, Jeeseong Hwang, Kenneth D. Weston, Kathryn L. Beers, Augustine Urbas, and Edwin L. Thomas
Appl. Opt. 42(19) 3864-3881 (2003)

Singular value analysis of the Mueller matrix in comparison with eigenvalue analysis of the coherency matrix in polarization characterization of media

Arezoo Zakeri, Mohammad Hossein Miran Baygi, and Khosro Madanipour
Appl. Opt. 52(33) 7859-7866 (2013)