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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 7 — Mar. 1, 2012
  • pp: 883–887

Measurement device for noise factor of microchannel plate

Liu Lei, Huang Zhijian, Pan Tao, and Qian Yunsheng  »View Author Affiliations

Applied Optics, Vol. 51, Issue 7, pp. 883-887 (2012)

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A new method for noise power factor determination of microchannel plates (MCPs) is described in this paper. The new measuring condition and specific measuring instrument are reported. The system consists of a vacuum chamber, an electron gun, a high-voltage supply, an imaging luminance meter, control units, a signal processing circuit, an A/D converter, a D/A converter, a communication unit, an industrial computer, and measurement software. This measuring method fills a void in measuring technology for the noise factor of MCPs, and it can make a scientific assessment of MCP noise characteristics and provide theoretical direction and technology support for the research and development of high-performance low light level (LLL) devices.

© 2012 Optical Society of America

OCIS Codes
(040.3780) Detectors : Low light level
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 15, 2011
Manuscript Accepted: December 2, 2011
Published: February 27, 2012

Liu Lei, Huang Zhijian, Pan Tao, and Qian Yunsheng, "Measurement device for noise factor of microchannel plate," Appl. Opt. 51, 883-887 (2012)

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