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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 9 — Mar. 20, 2012
  • pp: 1266–1275

Modal analysis and device considerations of thin high index dielectric overlay slab waveguides

Robert C. Gauthier, Kristian E. Medri, and Scott R. Newman  »View Author Affiliations


Applied Optics, Vol. 51, Issue 9, pp. 1266-1275 (2012)
http://dx.doi.org/10.1364/AO.51.001266


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Abstract

The effect of adding a thin high index dielectric overlay layer onto a 3-layer slab waveguide demonstrates several interesting features that can be exploited in integrated optical device configurations. A simple modal analysis is employed to examine the behavior of guided light launched from a 3-layer waveguide structure then coupled and propagated in the 4-layer overlay region. Modal properties typically overlooked in conventional slab waveguides are made use of in the design and theoretical analysis of an MMI device and optical index of refraction sensor. The optical structure presented here can form the backdrop waveguide design for more complex and active devices.

© 2012 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.3120) Integrated optics : Integrated optics devices
(130.6010) Integrated optics : Sensors
(130.2755) Integrated optics : Glass waveguides

ToC Category:
Integrated Optics

History
Original Manuscript: September 23, 2011
Revised Manuscript: November 15, 2011
Manuscript Accepted: November 16, 2011
Published: March 15, 2012

Citation
Robert C. Gauthier, Kristian E. Medri, and Scott R. Newman, "Modal analysis and device considerations of thin high index dielectric overlay slab waveguides," Appl. Opt. 51, 1266-1275 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-9-1266

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