Abstract
Periodic multilayer structures of quarterwave and multiple quarterwave stacks
with shifted ratios of high and low index layers in the half-wave pairs are
considered. Analytical dependencies of the reference wavelength reflectance and
the width of high reflectance zone on the number of layers, fraction quarterwave
and layer refractive indices are obtained. The structures are used as starting
designs for notch filters. Obtained dependencies allow one to estimate in
advance parameters required to achieve target spectral characteristics.
© 2013 Optical Society of America
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