OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 19 — Jul. 1, 2013
  • pp: 4724–4727

Measurement of the modulation transfer function of a charge-coupled device array by the combination of the self-imaging effect and slanted edge method

Sedigheh Najafi and Khosro Madanipour  »View Author Affiliations


Applied Optics, Vol. 52, Issue 19, pp. 4724-4727 (2013)
http://dx.doi.org/10.1364/AO.52.004724


View Full Text Article

Enhanced HTML    Acrobat PDF (576 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

In this paper, by a combination of the self-imaging effect for Ronchi gratings and the standard slanted edge modulation transfer function (MTF) measurement method for CCD cameras, the MTF of the CCD array without optics is measured. For this purpose, a Ronchi-type grating is illuminated by an expanded He–Ne laser. A self-image of the grating appears without optics on the CCD array that is located on the Talbot distance. The lines of the self-image of the grating are used as a slanted edge array. This method has all the advantages of the slanted edge method, and also since the array of the edge is ready, the total area of the CCD can be tested. The measured MTF is related to the CCD array without optics.

© 2013 Optical Society of America

OCIS Codes
(110.4100) Imaging systems : Modulation transfer function
(110.6760) Imaging systems : Talbot and self-imaging effects
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

ToC Category:
Imaging Systems

History
Original Manuscript: April 15, 2013
Revised Manuscript: May 25, 2013
Manuscript Accepted: May 26, 2013
Published: June 28, 2013

Citation
Sedigheh Najafi and Khosro Madanipour, "Measurement of the modulation transfer function of a charge-coupled device array by the combination of the self-imaging effect and slanted edge method," Appl. Opt. 52, 4724-4727 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-19-4724


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. C. Feltz and M. A. Karim, “Modulation transfer function of charge-coupled devices,” Appl. Opt. 29, 717–722 (1990). [CrossRef]
  2. M. Song and Y. Sun, “Measurement of the modulation transfer function of charge-coupled devices using frequency variable sine grating patterns,” Opt. Eng. 38, 1200–1204 (1999). [CrossRef]
  3. J. W. Coltman, “The specification of imaging properties by response to a sine wave input,” J. Opt. Soc. Am. 44, 468–471 (1954). [CrossRef]
  4. G. D. Boreman, “Modulation transfer function measurement using three and four bar targets,” Appl. Opt. 34, 8050–8052 (1995). [CrossRef]
  5. Z. Fang, “An approach for MTF measurement of discrete imaging system, electronic imaging, and multimedia technology,” Proc. SPIE 4925, 668–673 (2002).
  6. T. Choi and D. L. Helder, “Generic sensor modeling for modulation transfer function (MTF) estimation,” in Pecora 16 Global Priorities in Land Remote Sensing, Sioux Falls, South Dakota, 23–27 October2005.
  7. A. Daniels and D. Boreman, “Transparency targets for modulation transfer function measurement in the visible and infrared region,” Opt. Eng. 34, 860–868 (1995). [CrossRef]
  8. G. Boreman and E. L. Dereniak, “Method for measuring modulation transfer function of charge-coupled devices using laser speckle,” Opt. Eng. 25, 250148 (1986). [CrossRef]
  9. A. M. Pozo and A. Ferrero, “Improvements for determining the modulation transfer function of charge-coupled devices by the speckle method,” Opt. Express 14, 5928–5935 (2006). [CrossRef]
  10. J. Primot and M. Chambon, “Evaluation of the modulation transfer function of an infrared focal plane array using the Talbot effect,” J. Mod. Opt. 43, 347–354 (1996). [CrossRef]
  11. Y. Chen, X. Chen, and W. Shen, “A method for measuring modulation transfer function of CCD device in remote camera with grating pattern,” Proc. SPIE 6829, 68291B (2007).
  12. M. Estribeau and P. Magnan, “Fast MTF measurement of CMOS imagers using ISO 12233 slanted edge methodology,” Proc. SPIE 5251, 243–251 (2004). [CrossRef]
  13. P. D. Burns, “Slanted edge MTF for digital camera and scanner analysis,” in IS&T 2000 PICS Conference (Society for Imaging Science and Technology, 2011), pp. 135–138.
  14. D. Burns, “Application of Tatian’s method to slanted-edge MTF measurement,” Proc. SPIE 5668, 255–261 (2005).
  15. H. C. Rosu and J. P. Trevino, “Self-image effects in diffraction and dispersion,” Electromagn. Phenom. 6, 216–223 (2006).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited