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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 2 — Jan. 10, 2013
  • pp: 226–230

Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence

Yongli Liu, Jinlong Zhang, Xinbin Cheng, and Zhanshan Wang  »View Author Affiliations


Applied Optics, Vol. 52, Issue 2, pp. 226-230 (2013)
http://dx.doi.org/10.1364/AO.52.000226


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Abstract

Accurate directional transmittance can reduce uncertainty in parameters regression of optical thin-films. When directional transmittance is measured at large angle of incidence (AOI), a polarizer has to be used to produce linearly polarized light and it also becomes an error source. This study presents a method for accurate measurement of wideband transmittance at large AOI, which is aimed to eliminate the polarization error in measured transmittance at oblique incidence. Using this method, we can measure the directional transmittance with a good precision if a partially polarized incident beam is provided. This method reduces the requirement for the performance of the polarizer, and will find application in the highly integrated spectrophotometers.

© 2013 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(310.5448) Thin films : Polarization, other optical properties
(310.6188) Thin films : Spectral properties

ToC Category:
Thin Films

History
Original Manuscript: July 23, 2012
Revised Manuscript: December 4, 2012
Manuscript Accepted: December 5, 2012
Published: January 9, 2013

Citation
Yongli Liu, Jinlong Zhang, Xinbin Cheng, and Zhanshan Wang, "Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence," Appl. Opt. 52, 226-230 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-2-226

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