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Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences |
Applied Optics, Vol. 52, Issue 3, pp. 509-515 (2013)
http://dx.doi.org/10.1364/AO.52.000509
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Abstract
LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.
© 2013 Optical Society of America
OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
ToC Category:
X-ray Optics
History
Original Manuscript: August 2, 2012
Revised Manuscript: December 16, 2012
Manuscript Accepted: December 20, 2012
Published: January 18, 2013
Citation
Tatiana A. Pikuz, Anatoly Ya. Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander V. Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yasunori Senba, Tadashi Togashi, and Tetsuya Ishikawa, "Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences," Appl. Opt. 52, 509-515 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-3-509
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