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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 31 — Nov. 1, 2013
  • pp: 7479–7485

Transparency and stability of Ag-based metal–dielectric multilayers

M. C. Zhang, T. W. Allen, B. Drobot, S. McFarlane, A. Meldrum, and R. G. DeCorby  »View Author Affiliations


Applied Optics, Vol. 52, Issue 31, pp. 7479-7485 (2013)
http://dx.doi.org/10.1364/AO.52.007479


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Abstract

We fabricated and tested periodic metal (Ag)–dielectric (SiO2 or TiO2) multilayers with transparency bands in the visible range. For samples with AgTiO2 interfaces, the optical properties exhibited relatively poor predictability, likely due to oxidation of the Ag layers. Ag/SiO2-based multilayers were found to be more predictable and stable, but the relatively low refractive index of SiO2 limits their inherent transparency and pass-band bandwidth. We show that termination of the multilayer with a single high-index layer reduces the admittance mismatch with the ambient media, and thus improves the properties of the transparency band.

© 2013 Optical Society of America

OCIS Codes
(230.4170) Optical devices : Multilayers
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Thin Films

History
Original Manuscript: July 25, 2013
Revised Manuscript: September 25, 2013
Manuscript Accepted: September 26, 2013
Published: October 22, 2013

Citation
M. C. Zhang, T. W. Allen, B. Drobot, S. McFarlane, A. Meldrum, and R. G. DeCorby, "Transparency and stability of Ag-based metal–dielectric multilayers," Appl. Opt. 52, 7479-7485 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-31-7479

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