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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 31 — Nov. 1, 2013
  • pp: 7629–7637

Modified detection scheme for locating phase jumps and reducing detection errors

Jing-Feng Weng and Yu-Lung Lo  »View Author Affiliations


Applied Optics, Vol. 52, Issue 31, pp. 7629-7637 (2013)
http://dx.doi.org/10.1364/AO.52.007629


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Abstract

Most phase unwrapping algorithms shift the 2 π phase jump pixels to obtain the unwrapped phases, while most filtering algorithms remove the noisy pixels to avoid the fault of unwrapped phases. Thus, finding the positions of phase jump pixels and noisy pixels is important. This study proposed a modified detection scheme developed from the originally published noise and phase jump detection scheme [Opt. Express 19, 3086 (2011)]. The original detection scheme finds the noise positions and phase jump positions, and then marks these pixels in two maps, namely, the noise map and the phase jump map. One 2 π phase jump contains a 2 π -high position and a 0-low position. However, the original detection scheme usually finds a 2 π -high position and misses a corresponding 0-low position, or usually finds a 0-low position and misses a corresponding 2 π -high position. Moreover, the original detection scheme produces detection errors, containing the repeated pixels of phase jump or the wrong pixels generated by noise. Fortunately, the proposed modified detection scheme can find both the 2 π -high position and the corresponding 0-low position. Moreover, the detection errors are also reduced by the proposed modified detection scheme. The robustness of the modified detection scheme is demonstrated both numerically and experimentally.

© 2013 Optical Society of America

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(100.5088) Image processing : Phase unwrapping

ToC Category:
Image Processing

History
Original Manuscript: May 6, 2013
Revised Manuscript: July 3, 2013
Manuscript Accepted: August 4, 2013
Published: October 31, 2013

Citation
Jing-Feng Weng and Yu-Lung Lo, "Modified detection scheme for locating phase jumps and reducing detection errors," Appl. Opt. 52, 7629-7637 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-31-7629


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References

  1. J. F. Weng and Y. L. Lo, “Robust detection scheme on noise and phase jump for phase maps of objects with height discontinuities—theory and experiment,” Opt. Express 19, 3086–3105 (2011). [CrossRef]
  2. J. F. Weng and Y. L. Lo, “Integration of robust filters and phase unwrapping algorithms for image reconstruction of objects containing height discontinuities,” Opt. Express 20, 10896–10920 (2012). [CrossRef]
  3. B. F. Pouet and S. Krishnaswamy, “Technique for the removal of speckle phase in electronic speckle interferometry,” Opt. Lett. 20, 318–320 (1995). [CrossRef]
  4. I. Moon and B. Javidi, “Three-dimensional speckle-noise reduction by using coherent integral imaging,” Opt. Lett. 34, 1246–1248 (2009). [CrossRef]
  5. J. M. Huntley and H. Saldner, “Temporal phase-unwrapping algorithm for automated interferometry analysis,” Appl. Opt. 32, 3047–3052 (1993). [CrossRef]
  6. J. F. Weng and Y. L. Lo, “Novel rotation algorithm for phase unwrapping applications,” Opt. Express 20, 16838–16860 (2012). [CrossRef]
  7. R. Yamaki and A. Hirose, “Singularity-spreading phase unwrapping,” IEEE Trans. Geosci. Remote Sens. 45, 3240–3251 (2007). [CrossRef]
  8. W. H. Su, K. Shi, Z. Liu, B. Wang, K. Reichard, and S. Yin, “A large-depth-of-field projected fringe profilometry using supercontinuum light illumination,” Opt. Express 13, 1025–1032 (2005). [CrossRef]
  9. P. Potuluri, M. Fetterman, and D. Brady, “High depth of field microscopic imaging using an interferometric camera,” Opt. Express 8, 624–630 (2001). [CrossRef]
  10. H. O. Saldner and J. M. Huntley, “Temporal phase unwrapping: application to surface profiling of discontinuous objects,” Appl. Opt. 36, 2770–2775 (1997). [CrossRef]
  11. A. Wada, M. Kato, and Y. Ishii, “Large step-height measurements using multiple-wavelength holographic interferometry with tunable laser diodes,” J. Opt. Soc. Am. A 25, 3013–3020 (2008). [CrossRef]
  12. J. Jiang, J. Cheng, and B. Luong, “Unsupervised-clustering-driven noise-residue filter for phase images,” Appl. Opt. 49, 2143–2150 (2010). [CrossRef]
  13. W. W. Macy, “Two-dimensional fringe-pattern analysis,” Appl. Opt. 22, 3898–3901 (1983). [CrossRef]
  14. D. C. Ghiglia, G. Mastin, and L. A. Romero, “Cellular-automata method for phase unwrapping,” J. Opt. Soc. Am. A 4, 267–280 (1987). [CrossRef]
  15. A. Spik and D. W. Robinson, “Investigation of the cellular automata method for phase unwrapping and its implementation on an array processor,” Opt. Lasers Eng. 14, 25–37 (1991). [CrossRef]
  16. H. Y. Chang, C. W. Chen, C. K. Lee, and C. P. Hu, “The Tapestry Cellular Automata phase unwrapping algorithm for interferogram analysis,” Opt. Lasers Eng. 30, 487–502 (1998). [CrossRef]
  17. Y. Shi, “Robust phase unwrapping by spinning iteration,” Opt. Express 15, 8059–8064 (2007). [CrossRef]
  18. T. J. Flynn, “Two-dimensional phase unwrapping with minimum weighted discontinuity,” J. Opt. Soc. Am. A 14, 2692–2701 (1997). [CrossRef]
  19. M. A. Navarro, J. C. Estrada, M. Servin, J. A. Quiroga, and J. Vargas, “Fast two-dimensional simultaneous phase unwrapping and low-pass filtering,” Opt. Express 20, 2556–2561 (2012). [CrossRef]
  20. H. A. Aebischery and S. Waldner, “A simple and effective method for filtering speckle-interferometric phase fringe patterns,” Opt. Commun. 162, 205–210 (1999). [CrossRef]
  21. A. Capanni, L. Pezzati, D. Bertani, M. Cetica, and F. Francini, “Phase-shifting speckle interferometry: a noise reduction filter for phase unwrapping,” Opt. Eng. 36, 2466–2472 (1997). [CrossRef]
  22. K. Creath, “Phase shifting speckle interferometry,” Appl. Opt. 24, 3053–3058 (1985). [CrossRef]
  23. P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a sample error compensating phase calculation algorithm,” Appl. Opt. 26, 2504–2506 (1987). [CrossRef]

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