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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 31 — Nov. 1, 2013
  • pp: 7648–7653

Fringe-projection profilometry based on two-dimensional empirical mode decomposition

Suzhen Zheng and Yiping Cao  »View Author Affiliations


Applied Optics, Vol. 52, Issue 31, pp. 7648-7653 (2013)
http://dx.doi.org/10.1364/AO.52.007648


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Abstract

In 3D shape measurement, because deformed fringes often contain low-frequency information degraded with random noise and background intensity information, a new fringe-projection profilometry is proposed based on 2D empirical mode decomposition (2D-EMD). The fringe pattern is first decomposed into numbers of intrinsic mode functions by 2D-EMD. Because the method has partial noise reduction, the background components can be removed to obtain the fundamental components needed to perform Hilbert transformation to retrieve the phase information. The 2D-EMD can effectively extract the modulation phase of a single direction fringe and an inclined fringe pattern because it is a full 2D analysis method and considers the relationship between adjacent lines of a fringe patterns. In addition, as the method does not add noise repeatedly, as does ensemble EMD, the data processing time is shortened. Computer simulations and experiments prove the feasibility of this method.

© 2013 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 28, 2013
Revised Manuscript: September 3, 2013
Manuscript Accepted: October 7, 2013
Published: October 31, 2013

Citation
Suzhen Zheng and Yiping Cao, "Fringe-projection profilometry based on two-dimensional empirical mode decomposition," Appl. Opt. 52, 7648-7653 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-31-7648

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