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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 52, Iss. 4 — Feb. 1, 2013
  • pp: B1–B9

Accurate and fast stray radiation calculation based on improved backward ray tracing

Liu Yang, An XiaoQiang, and Wang Qian  »View Author Affiliations


Applied Optics, Vol. 52, Issue 4, pp. B1-B9 (2013)
http://dx.doi.org/10.1364/AO.52.0000B1


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Abstract

An improved method of backward ray tracing is proposed according to the theory of geometrical optics and thermal radiation heat transfer. The accuracy is essentially raised comparing to the traditional backward ray tracing because ray orders and weight factors are taken into account and the process is designed as sequential and recurring steps to trace and calculate different order stray lights. Meanwhile, it needs very small computation comparing to forward ray tracing because irrelevant surfaces and rays are excluded from the tracing. The effectiveness was verified in the stray radiation analysis for a cryogenic infrared (IR) imaging system, as the results coincided with the actual stray radiation irradiance distributions in the real images. The computation amount was compared with that of forward ray tracing in the narcissus calculation for another cryogenic IR imaging system, it was found that to produce the same accuracy result, the computation of the improved backward ray tracing is far smaller than that of forward ray tracing by at least 2 orders of magnitude.

© 2013 Optical Society of America

OCIS Codes
(110.3080) Imaging systems : Infrared imaging
(220.1230) Optical design and fabrication : Apodization
(290.1483) Scattering : BSDF, BRDF, and BTDF
(080.1753) Geometric optics : Computation methods
(290.2648) Scattering : Stray light
(290.6815) Scattering : Thermal emission

History
Original Manuscript: July 13, 2012
Revised Manuscript: September 5, 2012
Manuscript Accepted: September 5, 2012
Published: October 18, 2012

Citation
Liu Yang, An XiaoQiang, and Wang Qian, "Accurate and fast stray radiation calculation based on improved backward ray tracing," Appl. Opt. 52, B1-B9 (2013)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-4-B1

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