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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 1 — Jan. 1, 2014
  • pp: 141–146

Phase change measurement of birefringent optical devices with white light interferometry

Khos-Ochir Tsogvoo, Purevdorj Munkhbaatar, Byung Kwan Yang, Jin Seung Kim, and Kim Myung-Whun  »View Author Affiliations


Applied Optics, Vol. 53, Issue 1, pp. 141-146 (2014)
http://dx.doi.org/10.1364/AO.53.000141


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Abstract

This paper describes a method to determine the phase retardation of birefringent optical components by combining spectral interferometry and the Fourier transform method. The retardation of each orthogonal polarization component was resolved by using two rotatable linear polarizers in the interferometer. The phase retardation measured by using suggested method was compared to that measured using the conventional polarimetric method. The results of independent methods were well matched, which confirms the validity of the proposed method.

© 2013 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.3710) Materials : Liquid crystals
(230.6120) Optical devices : Spatial light modulators

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 2, 2013
Revised Manuscript: November 26, 2013
Manuscript Accepted: November 27, 2013
Published: December 24, 2013

Citation
Khos-Ochir Tsogvoo, Purevdorj Munkhbaatar, Byung Kwan Yang, Jin Seung Kim, and Kim Myung-Whun, "Phase change measurement of birefringent optical devices with white light interferometry," Appl. Opt. 53, 141-146 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-1-141


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