OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 21 — Jul. 20, 2014
  • pp: 4795–4803

Camera-based angular resolved spectroscopy system for spatial measurements of scattered light

Marko Jošt, Janez Krč, and Marko Topič  »View Author Affiliations


Applied Optics, Vol. 53, Issue 21, pp. 4795-4803 (2014)
http://dx.doi.org/10.1364/AO.53.004795


View Full Text Article

Enhanced HTML    Acrobat PDF (1536 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a system for the measurement of the three-dimensional (3D) angular distribution function (ADF) of scattered or emitted light using a digital camera. The 3D ADF can be determined from the digital image captured from a reflective flat screen. With the developed camera-based system we can quantify the transmitted light scattered by textured samples or the light emitted from light sources in a few second’s time. In the paper, the setup of the camera-based system is presented, the main transformations of the acquired digital image to obtain the 3D ADF are explained, and sensitivity issues are discussed. The system is applied to and validated on randomly nanotextured transparent samples and a calibrated light emitting device. Good matching is obtained with the measurements carried out with a conventional goniometric angular resolved scattering system.

© 2014 Optical Society of America

OCIS Codes
(040.5350) Detectors : Photovoltaic
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(290.5820) Scattering : Scattering measurements

ToC Category:
Scattering

History
Original Manuscript: February 27, 2014
Revised Manuscript: June 9, 2014
Manuscript Accepted: June 21, 2014
Published: July 18, 2014

Virtual Issues
Vol. 9, Iss. 9 Virtual Journal for Biomedical Optics

Citation
Marko Jošt, Janez Krč, and Marko Topič, "Camera-based angular resolved spectroscopy system for spatial measurements of scattered light," Appl. Opt. 53, 4795-4803 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-21-4795


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. D. Abou-Ras, Advanced Characterization Techniques for Thin Film Solar Cells (Wiley-VCH-Verl., 2011).
  2. G. Jost, T. Merdzhanova, T. Zimmermann, and J. Hüpkes, “Process monitoring of texture-etched high-rate ZnO:Al front contacts for silicon thin-film solar cells,” Thin Solid Films 532, 66–72 (2013). [CrossRef]
  3. K. Jäger, O. Isabella, R. A. C. M. M. van Swaaij, and M. Zeman, “Angular resolved scattering measurements of nano-textured substrates in a broad wavelength range,” Meas. Sci. Technol. 22, 105601 (2011). [CrossRef]
  4. J. Krč, M. Zeman, F. Smole, and M. Topič, “Optical modelling of thin-film silicon solar cells deposited on textured substrates,” Thin Solid Films 451/452, 298–302 (2004). [CrossRef]
  5. “CIE 127-2007 measurement of LEDs, Second Edition,” http://www.slashdocs.com/musiwz/cie-127-2007-measurement-of-leds-second-edition.html .
  6. J. Krč and M. Topič, Optical Modeling and Simulation of Thin-Film Photovoltaic Devices (CRC Press, 2013).
  7. J. Rifkin, K. A. Klicker, D. R. Bjork, D. R. Cheever, T. F. Schiff, J. C. Stover, F. M. Cady, D. J. Wilson, P. D. Chausse, and K. H. Kirchner, “Design review of a complete angle scatter instrument,” Proc. SPIE 1036, 116–124 (1989). [CrossRef]
  8. J. Krč, M. Zeman, O. Kluth, F. Smole, and M. Topič, “Effect of surface roughness of ZnO:Al films on light scattering in hydrogenated amorphous silicon solar cells,” Thin Solid Films 426, 296–304 (2003). [CrossRef]
  9. S. Schröder, T. Herffurth, H. Blaschke, and A. Duparré, “Angle-resolved scattering: an effective method for characterizing thin-film coatings,” Appl. Opt. 50, C164–C171 (2011). [CrossRef]
  10. C. Amra, D. Torricini, and P. Roche, “Multiwavelength (0.45–10.6  μm) angle-resolved scatterometer or how to extend the optical window,” Appl. Opt. 32, 5462–5474 (1993). [CrossRef]
  11. M. Foldyna, M. Moreno, P. R. i Cabarrocas, and A. De Martino, “Scattered light measurements on textured crystalline silicon substrates using an angle-resolved Mueller matrix polarimeter,” Appl. Opt. 49, 505–512 (2010). [CrossRef]
  12. M. Berner, M. Sämann, A. Garamoun, and M. B. Schubert, “Quantification of optical deflection by laser-structured ZnO:Al,” IEEE J. Photovolt. 3, 590–592 (2013).
  13. “Table-top system for light scatter measurement “Albatross-TT”—Fraunhofer IOF,” http://www.iof.fraunhofer.de/en/competences/messverfahren-und-charakterisierung/oberflaechen-schichtcharakterisierung/light_scatteringmeasurementandanalysis/albatross-tt.html .
  14. M. Bokalič, J. Raguse, J. R. Sites, and M. Topič, “Analysis of electroluminescence images in small-area circular CdTe solar cells,” J. Appl. Phys. 114, 123102 (2013). [CrossRef]
  15. B. Lipovšek, J. Krč, and M. Topič, “Optical model for thin-film photovoltaic devices with large surface textures at the front side,” Informacije MIDEM 41, 264–271 (2011).
  16. J. Peatross and M. Ware, “Physics of light and optics: a free online textbook,” in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optical Society of America, 2010), p. JWA64.
  17. O. Kluth, B. Rech, L. Houben, S. Wieder, G. Schöpe, C. Beneking, H. Wagner, A. Löffl, and H. W. Schock, “Texture etched ZnO:Al coated glass substrates for silicon based thin film solar cells,” Thin Solid Films 351, 247–253 (1999). [CrossRef]
  18. J. A. Sap, O. Isabella, K. Jäger, and M. Zeman, “Extraction of optical properties of flat and surface-textured transparent conductive oxide films in a broad wavelength range,” Thin Solid Films 520, 1096–1101 (2011). [CrossRef]
  19. “Spectroradiometric Components,” http://www.oceanoptics.com/Products/spectroradiometric.asp .

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited