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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 22 — Aug. 1, 2014
  • pp: 4910–4913

Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

Federico Sanjuan, Alexander Bockelt, and Borja Vidal  »View Author Affiliations

Applied Optics, Vol. 53, Issue 22, pp. 4910-4913 (2014)

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A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.

© 2014 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(260.3160) Physical optics : Interference
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: April 15, 2014
Revised Manuscript: June 19, 2014
Manuscript Accepted: June 20, 2014
Published: July 23, 2014

Federico Sanjuan, Alexander Bockelt, and Borja Vidal, "Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement," Appl. Opt. 53, 4910-4913 (2014)

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