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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 23 — Aug. 10, 2014
  • pp: 5092–5099

Resolution limits of extrinsic Fabry–Perot interferometric displacement sensors utilizing wavelength scanning interrogation

Nikolai Ushakov and Leonid Liokumovich  »View Author Affiliations


Applied Optics, Vol. 53, Issue 23, pp. 5092-5099 (2014)
http://dx.doi.org/10.1364/AO.53.005092


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Abstract

The factors limiting the resolution of displacement sensors based on the extrinsic Fabry–Perot interferometer were studied. An analytical model giving the dependency of extrinsic Fabry–Perot interferometric (EFPI) resolution on the parameters of an optical setup and a sensor interrogator was developed. The proposed model enables one to either estimate the limit of possible resolution achievable with a given setup, or derive the requirements for optical elements and/or a sensor interrogator necessary for attaining the desired sensor resolution. An experiment supporting the analytical derivations was performed, demonstrating a large dynamic measurement range (with cavity length from tens of microns to 5 mm), a high baseline resolution (from 14 pm), and good agreement with the model.

© 2014 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 14, 2014
Revised Manuscript: July 5, 2014
Manuscript Accepted: July 6, 2014
Published: August 4, 2014

Citation
Nikolai Ushakov and Leonid Liokumovich, "Resolution limits of extrinsic Fabry–Perot interferometric displacement sensors utilizing wavelength scanning interrogation," Appl. Opt. 53, 5092-5099 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-23-5092


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