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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 24 — Aug. 20, 2014
  • pp: 5527–5530

Measurement of principal refractive indices of birefringent wafer by analysis of Fabry–Perot interference fringes

Hee Joo Choi and Myoungsik Cha  »View Author Affiliations

Applied Optics, Vol. 53, Issue 24, pp. 5527-5530 (2014)

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We developed an efficient method for measuring the principal refractive indices and thickness of an optically anisotropic wafer that involves the analysis of Fabry–Perot interference fringes. Utilizing the birefringence of the medium, the 2π phase ambiguity was readily resolved in single-wavelength measurements of the birefringent medium index. Although the accuracy of the index measurements is limited due to the innate ambiguity, our analysis method overcame this limit and could determine the principal refractive indices and thickness with an uncertainty of 105. Our method was validated against measurements of a lithium niobate wafer for which the values of the indices are precisely known.

© 2014 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5710) Instrumentation, measurement, and metrology : Refraction
(160.1190) Materials : Anisotropic optical materials

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 10, 2014
Revised Manuscript: July 3, 2014
Manuscript Accepted: July 22, 2014
Published: August 19, 2014

Hee Joo Choi and Myoungsik Cha, "Measurement of principal refractive indices of birefringent wafer by analysis of Fabry–Perot interference fringes," Appl. Opt. 53, 5527-5530 (2014)

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