Abstract

A new instrument for absolute measurement of hyperspectral and angular reflection is presented. The instrument determines absolute values of angular reflection quantities in a wavelength range from 380 to 780 nm with a 3 nm spectral resolution by using a white source and a CCD-based spectroradiometer. Through uncertainty evaluation, the measurement uncertainty is determined as 1.4%–2.9% ($k=2$) for white diffuse material of Spectralon. The gonioreflectometric determination and an integrating-sphere-based reflection measurement traceable to KRISS spectral reflectance scale are compared by determining hemispherical reflectance, which results in agreement in their uncertainties.

© 2014 Optical Society of America

Gonioreflectometer for measuring spectral diffuse reflectance

Saulius Nevas, Farshid Manoocheri, and Erkki Ikonen
Appl. Opt. 43(35) 6391-6399 (2004)

Reflectances from a supercontinuum laser-based instrument: hyperspectral, polarimetric and angular measurements

Romain Ceolato, Nicolas Riviere, and Laurent Hespel
Opt. Express 20(28) 29413-29425 (2012)

Comparison measurements of 0∶45 radiance factor and goniometrically determined diffuse reflectance

Silja Holopainen, Farshid Manoocheri, Erkki Ikonen, Kai-Olaf Hauer, and Andreas Höpe
Appl. Opt. 48(15) 2946-2956 (2009)

Multiple-integrating sphere spectrophotometer for measuring absolute spectral reflectance and transmittance

G. A. Zerlaut and T. E. Anderson
Appl. Opt. 20(21) 3797-3804 (1981)

Comparison of methods for generation of absolute reflectance-factor values for bidirectional reflectance-distribution function studies

Xiaofan Feng, John R. Schott, and Timothy Gallagher
Appl. Opt. 32(7) 1234-1242 (1993)