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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A21–A26

Design of optical notch filters using apodized thickness modulation

Ove Lyngnes and James Kraus  »View Author Affiliations


Applied Optics, Vol. 53, Issue 4, pp. A21-A26 (2014)
http://dx.doi.org/10.1364/AO.53.000A21


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Abstract

An apodized thickness design method for discrete layer notch filters is presented. The method produces error tolerant designs with low ripple in the passband regions without any additional numerical optimization. Several apodization functions including Gaussian, cosine squared, as well as quintic are considered. Theoretical and experimental results from ion beam deposited sample designs for single-notch as well as multinotch filters are presented. Good agreement is observed between the theoretical design and the experimental measurement even when the deposition process is only controlled on time. This demonstrates the low layer error sensitivity of the apodized designs.

© 2013 Optical Society of America

OCIS Codes
(310.1620) Thin films : Interference coatings
(350.2460) Other areas of optics : Filters, interference
(310.4165) Thin films : Multilayer design
(310.6805) Thin films : Theory and design

History
Original Manuscript: August 29, 2013
Manuscript Accepted: September 23, 2013
Published: October 22, 2013

Citation
Ove Lyngnes and James Kraus, "Design of optical notch filters using apodized thickness modulation," Appl. Opt. 53, A21-A26 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-4-A21


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