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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 4 — Feb. 1, 2014
  • pp: A281–A286

Optical interference coatings measurement problem 2013 [Invited]

Angela Duparré and Detlev Ristau  »View Author Affiliations

Applied Optics, Vol. 53, Issue 4, pp. A281-A286 (2014)

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The 2013 Measurement Problem comprised the determination of the reflectance of a broadband antireflection (AR) coating in the spectral region from 400 to 700 nm at near 0° angle of incidence.

© 2014 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(310.1210) Thin films : Antireflection coatings
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: September 12, 2013
Manuscript Accepted: October 11, 2013
Published: January 15, 2014

Angela Duparré and Detlev Ristau, "Optical interference coatings measurement problem 2013 [Invited]," Appl. Opt. 53, A281-A286 (2014)

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  1. A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
  2. A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008). [CrossRef]
  3. A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011). [CrossRef]
  4. , “Optics and optical instruments—test methods for radiation scattered by optical components,” (International Organization for Standardization, 2002).

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