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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 5 — Feb. 10, 2014
  • pp: 960–970

Improved digital image correlation for in-plane displacement measurement

Asloob Ahmad Mudassar and Saira Butt  »View Author Affiliations


Applied Optics, Vol. 53, Issue 5, pp. 960-970 (2014)
http://dx.doi.org/10.1364/AO.53.000960


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Abstract

Electronic speckle photography (ESP) for in-plane displacement (IPD) and deformation measurements is well known with its more modern form, digital image correlation (DIC). Two speckle images of an optically rough surface before and after deformation, called reference and test images, are recorded and processed for IPD or deformation measurement of the test image with respect to the reference image. The reliability of ESP in measurements depends strongly on the postprocessing of the two images by DIC, which we have referred to as conventional DIC. In this paper, we are proposing a small but useful modification in the existing DIC methods by introducing some additional steps, which drastically improves the results obtained with the existing techniques. The modification to the conventional DIC method has been referred to as modified DIC. Computer-simulated and experimental results have been presented to validate the superiority of modified DIC over conventional DIC methods.

© 2014 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 1, 2013
Revised Manuscript: October 25, 2013
Manuscript Accepted: November 10, 2013
Published: February 7, 2014

Citation
Asloob Ahmad Mudassar and Saira Butt, "Improved digital image correlation for in-plane displacement measurement," Appl. Opt. 53, 960-970 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-5-960


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