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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 6, Iss. 12 — Dec. 1, 1967
  • pp: 2071–2078

Plasma Spectroscopy in the Vacuum Ultraviolet and Soft X-ray Regions

R. C. Elton and N. V. Roth  »View Author Affiliations


Applied Optics, Vol. 6, Issue 12, pp. 2071-2078 (1967)
http://dx.doi.org/10.1364/AO.6.002071


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Abstract

Techniques involved in the spectroscopy of pulsed plasma sources in the vacuum ultraviolet and soft x-ray spectral regions are described in connection with recent developments in a high temperature plasma physics program. The time-integrated spectrum between 15 Å and 1800 Å has been analyzed using semiautomatic computer techniques for the grazing incidence portion. Time resolved absolute intensity measurements of 0 iii- O viii ion lines are described as related to recent results on energy losses and impurity content, as well as excitation rate coefficients. Broadband measurements of x-ray continuum radiation with four simultaneous detection channels are also described, and typical results of computer calculations necessary for the interpretation in terms of electron temperature are included.

Citation
R. C. Elton and N. V. Roth, "Plasma Spectroscopy in the Vacuum Ultraviolet and Soft X-ray Regions," Appl. Opt. 6, 2071-2078 (1967)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-6-12-2071

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