Equations are developed for the flow of radiant power, transmittance, and absorptance of an absorbing multilayer, in terms of its characteristic matrix and the admittance of the surrounding media. This is applied to the design of bandpass filters and absorbing coatings. Some uv bandpass filters which contain several aluminum films are designed.
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Defined in terms of the matrix elements of the absorbing stack.
Table VI
The Design of Matching Stacks and Bandpass Filtersa
Name of the configuration
Design
Stack 1
0.74 B(LB)8L quartz
Stack 2
1.77L B (LH)4 quartz
Stack 3
1.77LB (LH)4 (LB)4 (BL)5 quartz
Filter 1
air (BL)7B 1.77LM stack 1
Filter 2
air (LH)5 1.74BM stack 2
Filter 3
air (BL)5 (LB)5 (LH)5 1.74BM stack 3
B, L, and H represent films of quarter-wave optical thickness at λ0, of refractive index 1.55, 1.36, and 1.80, respectively. M represents an aluminum film of 250 Å thickness and has optical constants n = 0.20, k = 2.80 at λ0 = 2536 Å. The substrate is quartz, index 1.47, and the incident medium is air. 1.77 L represents a low index film of optical thickness of 1.77 quarter-waves at λ0, and so on.
Defined in terms of the matrix elements of the absorbing stack.
Table VI
The Design of Matching Stacks and Bandpass Filtersa
Name of the configuration
Design
Stack 1
0.74 B(LB)8L quartz
Stack 2
1.77L B (LH)4 quartz
Stack 3
1.77LB (LH)4 (LB)4 (BL)5 quartz
Filter 1
air (BL)7B 1.77LM stack 1
Filter 2
air (LH)5 1.74BM stack 2
Filter 3
air (BL)5 (LB)5 (LH)5 1.74BM stack 3
B, L, and H represent films of quarter-wave optical thickness at λ0, of refractive index 1.55, 1.36, and 1.80, respectively. M represents an aluminum film of 250 Å thickness and has optical constants n = 0.20, k = 2.80 at λ0 = 2536 Å. The substrate is quartz, index 1.47, and the incident medium is air. 1.77 L represents a low index film of optical thickness of 1.77 quarter-waves at λ0, and so on.
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