Abstract
A portable, rugged, inexpensive shearing interferometer is described and evaluated. Originally intended for application to plasma and flow analysis, it is also a suitable instructional aid. The shearing is obtained by the offset of the reflection from the first surface of a mirror relative to the reflection from the second surface when the mirror is set at an angle to the illuminating beam. The sensitivity is equivalent to that of a schlieren system. However, no schlieren quality components are involved and there are no critical adjustments or dimensions.
© 1970 Optical Society of America
Full Article | PDF ArticleMore Like This
M. V. R. K. Murty
Appl. Opt. 9(5) 1146-1148 (1970)
M. E. Riley and M. A. Gusinow
Appl. Opt. 16(10) 2753-2756 (1977)
J. B. Saunders
Appl. Opt. 6(9) 1581-1583 (1967)