Abstract

A spectral scanning technique is described which is capable of spectral scanning in the ultraviolet, visible, and infrared regions in times as short as fractions of a microsecond, with scan repetition rates of the order of a reciprocal scan time. The technique utilizes an electrooptic material to deflect the dispersed light in a monochromator past a fixed exit slit. Scan ranges up to two hundred times the theoretical resolution of the monochromator employed can be obtained in the visible spectral region. Results are presented for scans in the visible and infrared (2.7 μm) spectral regions using LiNbO₃ as the electrooptic element.

© 1970 Optical Society of America

Comments on: High Speed Electrooptic Spectral Scanning

L Beiser
Appl. Opt. 10(9) 2188-2188 (1971)

Design Criteria for a Raman Spectrometer

C. D. Allemand
Appl. Opt. 9(6) 1304-1311 (1970)

Scanned Laser Infrared Microscope

B. Sherman and J. F. Black
Appl. Opt. 9(4) 802-809 (1970)

High-resolution electrooptic surface prism waveguide deflector: an analysis

Joseph F. Revelli
Appl. Opt. 19(3) 389-397 (1980)

Synchronized High Speed Scanning Infrared Spectrometer

John C. Camm, Raymond L. Taylor, and Robert Lynch
Appl. Opt. 6(5) 885-891 (1967)