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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 29, Iss. 7 — Mar. 1, 1990
  • pp: 959–974

Optics InfoBase > Applied Optics > Volume 29 > Issue 7 > Two-channel polarization modulation ellipsometer

Two-channel polarization modulation ellipsometer

Gerald E. Jellison, Jr. and F. A. Modine  »View Author Affiliations


Applied Optics, Vol. 29, Issue 7, pp. 959-974 (1990)
http://dx.doi.org/10.1364/AO.29.000959


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Abstract

A new wavelength-scanning two-channel polarization modulation ellipsometer is described, where a photo-elastic modulator is used and the analyzed light is separated into orthogonally polarized beams using a Wollaston prism. Both beams are detected using phototubes whose bias voltage is dynamically controlled for constant dc. The dc from each phototube is measured with a digital voltmeter, and the fundamental and second harmonic of the phototube current are measured using individual lock-in amplifiers. All three of the associated ellipsometric parameters (N = cos2ψ, S = sin2ψ sinΔ, and C = sin2ψ cosΔ) can be determined simultaneously in a single scan. The versatility of the instrument is demonstrated by the determination of the optical functions of Si from 238 to 652 nm (5.3–1.9 eV).

© 1990 Optical Society of America

History
Original Manuscript: June 28, 1989
Published: March 1, 1990

Citation
Gerald E. Jellison and F. A. Modine, "Two-channel polarization modulation ellipsometer," Appl. Opt. 29, 959-974 (1990)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-29-7-959


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