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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1478–1483

Optics InfoBase > Applied Optics > Volume 45 > Issue 7 > Efficient analytic computation of dispersion from multilayer structures

Efficient analytic computation of dispersion from multilayer structures

Jonathan R. Birge and Franz X. Kärtner  »View Author Affiliations


Applied Optics, Vol. 45, Issue 7, pp. 1478-1483 (2006)
http://dx.doi.org/10.1364/AO.45.001478


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Abstract

We demonstrate an inductive method for computing exact derivatives of reflection phase for layered media by using the transfer-matrix formalism. The algorithm scales linearly with the number of layers. We show a physically realistic approximation that leads to an efficient procedure for accurately computing dispersion significantly faster than with standard finite-difference methods. We discuss the theory behind the approximation and show results for a dispersion-compensating chirped mirror from a Ti:sapphire laser.

© 2006 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(320.0320) Ultrafast optics : Ultrafast optics

ToC Category:
Structure and Fast Coatings

History
Original Manuscript: March 2, 2005
Manuscript Accepted: June 30, 2005

Citation
Jonathan R. Birge and Franz X. Kärtner, "Efficient analytic computation of dispersion from multilayer structures," Appl. Opt. 45, 1478-1483 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-7-1478

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