Millimeter-wave antireflection coating for cryogenic silicon lenses
Applied Optics, Vol. 45, Issue 16, pp. 3746-3751 doi:10.1364/AO.45.003746
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- OCIS Codes:
- (220.0220) Optical design and fabrication : Optical design and fabrication
- (220.4840) Optical design and fabrication : Testing
Citation
Judy Lau, Joseph Fowler, Tobias Marriage, Lyman Page, Jon Leong, Edward Wishnow, Ross Henry, Ed Wollack, Mark Halpern, Danica Marsden, and Gaelen Marsden, "Millimeter-wave antireflection coating for cryogenic silicon lenses," Appl. Opt. 45, 3746-3751 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-16-3746
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We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.
© 2006 Optical Society of America
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History
Original Manuscript: August 31, 2005
Manuscript Accepted: October 26, 2005
Revised Manuscript: October 15, 2005
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Author Affiliations
Case Western Reserve University
Lawrence Livermore National Laboratory
NASA Goddard Space Flight Center
Princeton University
Princeton UniversityUniversity of British Columbia
University of British Columbia
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