A method has been developed for finding the half-intensity width, to an accuracy of ±5%, of the profiles of spectral lines photographed in the vacuum ultraviolet. Plate calibration is achieved by an aperture restriction device placed at the Sirks focus of a 3-meter normal incidence vacuum spectrograph. This gives a stepped intensity in the focal plane with a standard ratio of 2:1. The measurement is not affected by reciprocity law failure or intermittency effect in the photographic emulsion, and can be used with pulsed light sources.
© 1962 Optical Society of America
Original Manuscript: November 9, 1961
Published: May 1, 1962
B. B. Jones, "A Method for Obtaining Accurate Half-Intensity Widths of Spectral Lines Photographed in the Vacuum Ultraviolet," Appl. Opt. 1, 239-242 (1962)