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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 1, Iss. 3 — May. 1, 1962
  • pp: 239–242

A Method for Obtaining Accurate Half-Intensity Widths of Spectral Lines Photographed in the Vacuum Ultraviolet

B. B. Jones  »View Author Affiliations


Applied Optics, Vol. 1, Issue 3, pp. 239-242 (1962)
http://dx.doi.org/10.1364/AO.1.000239


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Abstract

A method has been developed for finding the half-intensity width, to an accuracy of ±5%, of the profiles of spectral lines photographed in the vacuum ultraviolet. Plate calibration is achieved by an aperture restriction device placed at the Sirks focus of a 3-meter normal incidence vacuum spectrograph. This gives a stepped intensity in the focal plane with a standard ratio of 2:1. The measurement is not affected by reciprocity law failure or intermittency effect in the photographic emulsion, and can be used with pulsed light sources.

© 1962 Optical Society of America

History
Original Manuscript: November 9, 1961
Published: May 1, 1962

Citation
B. B. Jones, "A Method for Obtaining Accurate Half-Intensity Widths of Spectral Lines Photographed in the Vacuum Ultraviolet," Appl. Opt. 1, 239-242 (1962)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-1-3-239

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