Internal Reflection Spectroscopy: Validity of Effective Thickness Equations
Applied Optics, Vol. 10, Issue 1, pp. 19-23 (1971)
http://dx.doi.org/10.1364/AO.10.000019
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Abstract
The validity of effective thickness expressions for sample films used in internal reflection spectroscopy is obtained by comparing them to exact computer calculations for various refractive indices, angles of incidence, extinction coefficients, and film thicknesses.
Citation
N. J. Harrick and A. I. Carlson, "Internal Reflection Spectroscopy: Validity of Effective Thickness Equations," Appl. Opt. 10, 19-23 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-1-19
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