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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 1 — Jan. 1, 1971
  • pp: 19–23

Internal Reflection Spectroscopy: Validity of Effective Thickness Equations

N. J. Harrick and A. I. Carlson  »View Author Affiliations


Applied Optics, Vol. 10, Issue 1, pp. 19-23 (1971)
http://dx.doi.org/10.1364/AO.10.000019


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Abstract

The validity of effective thickness expressions for sample films used in internal reflection spectroscopy is obtained by comparing them to exact computer calculations for various refractive indices, angles of incidence, extinction coefficients, and film thicknesses.

© 1971 Optical Society of America

History
Original Manuscript: May 5, 1970
Published: January 1, 1971

Citation
N. J. Harrick and A. I. Carlson, "Internal Reflection Spectroscopy: Validity of Effective Thickness Equations," Appl. Opt. 10, 19-23 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-1-19


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References

  1. N. J. Harrick, F. K. du Pré, Appl. Opt. 5, 1739 (1966). [CrossRef] [PubMed]
  2. N. J. Harrick, Internal Reflection Spectroscopy (Interscience-Wiley, New York, 1967).
  3. Fluornoy and Huntsburger have shown previously that reflectivity decrease vs film thickness follows curve similar to those in Figs. 2–5. They placed nitrocellulose films of various thickness on a Ge reflection plate and measured the strength of an absorption band at a wavelength of 6.03 μ vs film thickness. (See Fig. 7, p 24 of Ref. 2.)
  4. See, e.g., J. A. Stratton, Electromagnetic Theory (McGraw-Hill1941, New York, p. 515.

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