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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 10 — Oct. 1, 1971
  • pp: 2344–2349

Determination of Refractive Index and Film Thickness from Interference Fringes

N. J. Harrick  »View Author Affiliations


Applied Optics, Vol. 10, Issue 10, pp. 2344-2349 (1971)
http://dx.doi.org/10.1364/AO.10.002344


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Abstract

Simple equations are given for determining both refractive index and film thickness from a measurement of interference fringe separation where the question of phase change and the order of the fringes can be disregarded. The equations are quite general, since they apply to fringe maxima or minima for either transmission or reflection and can be used for free-standing films or films on substarates of higher refractive index. Advantages of recording fringes via reflection rather than transmission are discussed. A unique attachment for commercial spectrophotometers for making measurements over a wide range of angles of incidence is described.

© 1971 Optical Society of America

History
Original Manuscript: April 29, 1971
Published: October 1, 1971

Citation
N. J. Harrick, "Determination of Refractive Index and Film Thickness from Interference Fringes," Appl. Opt. 10, 2344-2349 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-10-2344


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References

  1. See, e.g., F. A. Jenkins, H. E. White, Fundamentals of Optics (McGraw-Hill, New York, 1957).
  2. N. J. Harrick, Internal Reflection Spectroscopy (Wiley, Interscience, New York, 1967).
  3. See, e.g., J. D. E. McIntyre, D. E. Aspnes, Surface Sci. 24, 417 (1971). [CrossRef]

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