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Applied Optics

Applied Optics


  • Vol. 10, Iss. 12 — Dec. 1, 1971
  • pp: 2639–2643

Evaluation of the Emissivity of a Cavity Source by Reflection Measurements

G. Bauer and K. Bischoff  »View Author Affiliations

Applied Optics, Vol. 10, Issue 12, pp. 2639-2643 (1971)

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The emissivity c of cylindrical cavities with different bases (flat, perpendicular to the axis; flat, inclined to the axis; conical) is derived from measurements of the cavity reflectance ρc. A general formula for the calclation of ρc = 1 − c is given, which holds for high values of the ratio length L of the cylinder to radius R of the cylinder. For a flat base perpendicular to the axis only the value of the reflectance ρ0 of the wall material is needed; in both other cases one must refer to the measurements.

© 1971 Optical Society of America

Original Manuscript: May 12, 1971
Published: December 1, 1971

G. Bauer and K. Bischoff, "Evaluation of the Emissivity of a Cavity Source by Reflection Measurements," Appl. Opt. 10, 2639-2643 (1971)

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  1. E. M. Sparrow, L. U. Albers, E. R. G. Eckert, J. Heat Transf. 84, 73 (1962). [CrossRef]
  2. G. Bauer, Optik 28, 177 (1968).
  3. G. Bauer, Optik 18, 603 (1961).
  4. F. J. Kelly, D. G. Moore, Appl. Opt. 4, 31 (1965). [CrossRef]
  5. G. Bauer, K. Bischoff, Optik 31, 507 (1970).
  6. K. C. Lapworth, T. J. Quinn, L. A. Allnut, J. Phys. E 3, 116 (1970). [CrossRef]
  7. F. J. Kelly, Appl. Opt. 5, 925 (1966). [CrossRef] [PubMed]

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