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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 12 — Dec. 1, 1971
  • pp: 2639–2643

Evaluation of the Emissivity of a Cavity Source by Reflection Measurements

G. Bauer and K. Bischoff  »View Author Affiliations


Applied Optics, Vol. 10, Issue 12, pp. 2639-2643 (1971)
http://dx.doi.org/10.1364/AO.10.002639


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Abstract

The emissivity c of cylindrical cavities with different bases (flat, perpendicular to the axis; flat, inclined to the axis; conical) is derived from measurements of the cavity reflectance ρc. A general formula for the calclation of ρc = 1 − c is given, which holds for high values of the ratio length L of the cylinder to radius R of the cylinder. For a flat base perpendicular to the axis only the value of the reflectance ρ0 of the wall material is needed; in both other cases one must refer to the measurements.

© 1971 Optical Society of America

History
Original Manuscript: May 12, 1971
Published: December 1, 1971

Citation
G. Bauer and K. Bischoff, "Evaluation of the Emissivity of a Cavity Source by Reflection Measurements," Appl. Opt. 10, 2639-2643 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-12-2639

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