Ellipsometry Using Imperfect Polarizers
Applied Optics, Vol. 10, Issue 12, pp. 2679-2684 (1971)
http://dx.doi.org/10.1364/AO.10.002679
Acrobat PDF (710 KB)
Abstract
Recent work in which reflection polarizers were used to make ellipsometric measurements in the far uv employed the tacit assumption that the incident light was in a coherent state of polarization. However, since the most general state of light is that of partial polarization, i.e., a mixture of polarized and unpolarized components, a significant modification to the experimental techniques used hitherto is shown to be necessary.
Citation
R. H. W. Graves, "Ellipsometry Using Imperfect Polarizers," Appl. Opt. 10, 2679-2684 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-12-2679
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 