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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 12 — Dec. 1, 1971
  • pp: 2679–2684

Ellipsometry Using Imperfect Polarizers

R. H. W. Graves  »View Author Affiliations


Applied Optics, Vol. 10, Issue 12, pp. 2679-2684 (1971)
http://dx.doi.org/10.1364/AO.10.002679


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Abstract

Recent work in which reflection polarizers were used to make ellipsometric measurements in the far uv employed the tacit assumption that the incident light was in a coherent state of polarization. However, since the most general state of light, is that of partial polarization, i.e., a mixture of polarized and unpolarized components, a significant modification to the experimental techniques used hitherto is shown to be necessary.

© 1971 Optical Society of America

History
Original Manuscript: July 7, 1971
Published: December 1, 1971

Citation
R. H. W. Graves, "Ellipsometry Using Imperfect Polarizers," Appl. Opt. 10, 2679-2684 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-12-2679


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References

  1. G. Rosenbaum et al., Appl. Opt. 7, 1917 (1968). [CrossRef] [PubMed]
  2. M. Schledermann, M. Skibowski, Appl. Opt. 10, 321 (1971). [CrossRef] [PubMed]
  3. M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1959), p. 550.
  4. Ref. 3, p. 545.
  5. Synchrotron radiation was used as a source, and this is in theory fully elliptically polarized. However, scattering within the system could cause partial depolarization. Furthermore, the results of studies of synchrotron polarization in the visible region [P. Joos, Phys. Rev. Lett. 4, 558 (1960); K. Codling, R. P. Madden, J. Appl. Phys. 36, 380 (1965)] do not exclude the possibility of there being a small unpolarized component in such radiation. [CrossRef]
  6. D. G. Avery, Proc. Phys. Soc. B65, 425 (1952).
  7. I. H. Malitson, J. Opt. Soc. Am. 55, 1205 (1965). [CrossRef]
  8. S. P. F. Humphreys-Owen, Proc. Phys. Soc. 77, 949 (1961). [CrossRef]

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