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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 12 — Dec. 1, 1971
  • pp: 2679–2684

Ellipsometry Using Imperfect Polarizers

R. H. W. Graves  »View Author Affiliations


Applied Optics, Vol. 10, Issue 12, pp. 2679-2684 (1971)
http://dx.doi.org/10.1364/AO.10.002679


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Abstract

Recent work in which reflection polarizers were used to make ellipsometric measurements in the far uv employed the tacit assumption that the incident light was in a coherent state of polarization. However, since the most general state of light, is that of partial polarization, i.e., a mixture of polarized and unpolarized components, a significant modification to the experimental techniques used hitherto is shown to be necessary.

© 1971 Optical Society of America

History
Original Manuscript: July 7, 1971
Published: December 1, 1971

Citation
R. H. W. Graves, "Ellipsometry Using Imperfect Polarizers," Appl. Opt. 10, 2679-2684 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-12-2679

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