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Applied Optics

Applied Optics


  • Vol. 10, Iss. 12 — Dec. 1, 1971
  • pp: 2717–2721

Michelson Interferometer as a Remote Gauge

R. A. Patten  »View Author Affiliations

Applied Optics, Vol. 10, Issue 12, pp. 2717-2721 (1971)

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The Michelson interferometer may be used to measure the separation between two parallel surfaces which are distant from the interferometer. A beam of light incident normal to these surfaces must be at least partially reflected back to the interferometer by each surface in order for the technique to work. The results of three measurements using this technique are described, and the effect of dispersion is discussed.

© 1971 Optical Society of America

Original Manuscript: June 11, 1971
Published: December 1, 1971

R. A. Patten, "Michelson Interferometer as a Remote Gauge," Appl. Opt. 10, 2717-2721 (1971)

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  1. P. D. Fochs, J. Opt. Soc. Am. 40, 623 (1950). [CrossRef]
  2. M. A. Jeppeson, A. M. Taylor, J. Opt. Soc. Am. 56, 451 (1966). [CrossRef]
  3. G. H. Lovins, Appl. Opt. 9, 1935 (1970). [PubMed]
  4. H. H. Hopkins, in Advanced Optical Techniques, A. C. S. Van Heel, Ed. (North-Holland, Amsterdam, 1967), pp. 189 ff.
  5. Hewlett Packard Co., model 5525 A laser interferometer.

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