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Applied Optics

Applied Optics


  • Vol. 10, Iss. 2 — Feb. 1, 1971
  • pp: 333–337

Some Film-Noise Measurements by Diffraction of Coherent Light

H. Stark  »View Author Affiliations

Applied Optics, Vol. 10, Issue 2, pp. 333-337 (1971)

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It is known that the diffraction of coherent light can be used for various spatial-noise measurements including the power-spectrum estimation of photographic emulsions. A number of such measurements are presented. The power spectrum of grain noise is compared with several theoretical models. The spectra of grain and phase noise for overexposed film are obtained. A simple procedure for obtaining the variance of the phase noise of photographic film, assuming gaussian statistics and statistical independence between grain and phase noise, is furnished.

© 1971 Optical Society of America

Original Manuscript: June 1, 1970
Published: February 1, 1971

H. Stark, "Some Film-Noise Measurements by Diffraction of Coherent Light," Appl. Opt. 10, 333-337 (1971)

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  1. H. Stark, W. Bennett, M. Arm, Appl. Opt. 8, 11 (1969). [CrossRef]
  2. E. L. O’Neill, Introduction to Statistical Optics (Addison-Wesley, Reading, Mass., 1963).
  3. M. Savelli, Compt. Rend. 246, 3605 (1958).
  4. L. Silberstein, Phil. Mag. 44, 257(1922).

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