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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 10, Iss. 2 — Feb. 1, 1971
  • pp: 333–337

Some Film-Noise Measurements by Diffraction of Coherent Light

H. Stark  »View Author Affiliations


Applied Optics, Vol. 10, Issue 2, pp. 333-337 (1971)
http://dx.doi.org/10.1364/AO.10.000333


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Abstract

It is known that the diffraction of coherent light can be used for various spatial-noise measurements including the power-spectrum estimation of photographic emulsions. A number of such measurements are presented. The power spectrum of grain noise is compared with several theoretical models. The spectra of grain and phase noise for overexposed film are obtained. A simple procedure for obtaining the variance of the phase noise of photographic film, assuming gaussian statistics and statistical independence between grain and phase noise, is furnished.

© 1971 Optical Society of America

History
Original Manuscript: June 1, 1970
Published: February 1, 1971

Citation
H. Stark, "Some Film-Noise Measurements by Diffraction of Coherent Light," Appl. Opt. 10, 333-337 (1971)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-10-2-333

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