Abstract

A mathematical analysis of the application of moiré fringe contouring to fluid film thickness measurement is made. Two special cases are treated. The first considers the generation of contours with a collimated light source and distant observer. The second analyzes the fringe patterns viewed by an observer near the grid when there is a point source of light. Geometrical restrictions imposed on the experimental setup are detailed. Experimental results are included.

© 1972 Optical Society of America

Measurement of Vibrational Amplitude by Modulation of Projected Fringes

C. M. Vest and D. W. Sweeney
Appl. Opt. 11(2) 449-454 (1972)

Moiré depth contouring

F. Heiniger and T. Tschudi
Appl. Opt. 18(10) 1577-1581 (1979)

Moiré Gauging of In-Plane Displacement Using Double Aperture Imaging

Donald E. Duffy
Appl. Opt. 11(8) 1778-1781 (1972)

Monitoring the Thickness of Thin MgF₂ and LiF Films on Al by Reflectance Measurements Using the 1216-Å Line of Hydrogen

E. T. Hutcheson, J. T. Cox, G. Hass, and W. R. Hunter
Appl. Opt. 11(7) 1590-1593 (1972)

Generation of Surface Contours by Moiré Patterns

D. M. Meadows, W. O. Johnson, and J. B. Allen
Appl. Opt. 9(4) 942-947 (1970)