An apparatus has been designed and constructed for measuring the coefficient of linear thermal expansion in the 30–250°C temperature range for samples as small as 13 mm in length and 6 mm in diameter. Similarities between this apparatus and one previously built for measurements from room temperature down to 10 K are reviewed; important modifications appropriate to the high temperature range are discussed in detail. Measurements were made at 25°C intervals on two infrared-transmitting optical materials: polycrystalline cadmium sulfide (Eastman Kodak Co.) and chalcogenide glass 20, composition Ge₃₃Se₅₅As_l2 (Texas Instruments, Inc.). Measurements were also made on a sample of Corning crown glass 8263; the results are compared with Corning data. Finally, it is shown that the thermal expansion coefficients determined with this high temperature apparatus are compatible with those obtained with the above-mentioned low temperature device.

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