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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 11, Iss. 8 — Aug. 1, 1972
  • pp: 1778–1781

Moiré Gauging of In-Plane Displacement Using Double Aperture Imaging

Donald E. Duffy  »View Author Affiliations


Applied Optics, Vol. 11, Issue 8, pp. 1778-1781 (1972)
http://dx.doi.org/10.1364/AO.11.001778


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Abstract

An easily implemented method of measuring in-plane surface displacement by photographing an object through two laterally displaced apertures is described and the experimental results are presented. The displacement is displayed as a pattern of moiré fringes over the image. No previously constructed grids or rulings are required as in normal moiré devices. The method is noncontacting and requires no special surface preparation. The sensitivity is easily adjusted and is shown to be equivalent to that obtained using double-exposure holography or speckle pattern interferometry techniques. The method has potential application in mechanically unstable environments or where the conditions are such that grids or strain gauges cannot be attached to the object.

© 1972 Optical Society of America

History
Original Manuscript: December 9, 1971
Published: August 1, 1972

Citation
Donald E. Duffy, "Moiré Gauging of In-Plane Displacement Using Double Aperture Imaging," Appl. Opt. 11, 1778-1781 (1972)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-11-8-1778


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References

  1. R. E. Brooks, L. O. Heflinger, Appl. Opt. 8, 935 (1969). [CrossRef] [PubMed]
  2. R. W. E. Cook, Opt. Laser Technol. 3, 71 (1971). [CrossRef]
  3. A. E. Ennos, J. Phys. E (Sci. Instrum.) 1, 731 (1968). [CrossRef]
  4. J. W. C. Gates, Opt. Technol. 2, 247 (1969). [CrossRef]
  5. J. A. Leendertz, J. Phys. E (Sci. Instrum.) 3, 214 (1970). [CrossRef]
  6. J. N. Butters, J. A. Leendertz, J. Phys. E (Sci. Instrum.) 4, 277 (1971). [CrossRef]
  7. E. Archbold, J. M. Burch, A. E. Ennos, Optica Acta 17, 883 (1970). [CrossRef]
  8. Y. Nishijima, G. Oster, J. Opt. Soc. Am. 54, 1 (1964). [CrossRef]

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