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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 11, Iss. 9 — Sep. 1, 1972
  • pp: 1916–1918

Refractive Index Measurement by Interference Microscopy: Corrections for Dispersion

William D. Ross  »View Author Affiliations


Applied Optics, Vol. 11, Issue 9, pp. 1916-1918 (1972)
http://dx.doi.org/10.1364/AO.11.001916


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Abstract

The refractive index of a particle can be determined with microscope equipment for measuring interference in transmitted light. If the path difference is several wavelengths, white illumination will be used. If the particle has strong dispersion, measurements made with white light give an apparent refractive index much higher than the true one. The apparent index is related to the group velocity of light waves in the substance in the same way that the true index is related to phase velocity. Flaky crystals of hematite showed apparent index 4.52, in agreement with theory, compared with the true ordinary index around 3.09.

© 1972 Optical Society of America

History
Original Manuscript: January 7, 1972
Published: September 1, 1972

Citation
William D. Ross, "Refractive Index Measurement by Interference Microscopy: Corrections for Dispersion," Appl. Opt. 11, 1916-1918 (1972)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-11-9-1916

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