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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 12, Iss. 3 — Mar. 1, 1973
  • pp: 551–554

Particle-Size Determination by Low-Angle Light Scattering: Effect of Refractive Index

E. J. Meehan and A. E. Gyberg  »View Author Affiliations


Applied Optics, Vol. 12, Issue 3, pp. 551-554 (1973)
http://dx.doi.org/10.1364/AO.12.000551


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Abstract

The intensity of scattering I(θ) by transparent and absorbing spheres has been calculated from exact Mie theory for values of radius from 0.1 μm to 100 μm, wavelength 5461 Å, and the following values of refractive index mim′: (1) m = 1.01, 1.05, 1.1 (0.1) 2.0, m′ = 0; (2) m = 2, m′ = 0.002, 0.02, 0.2, and 2. The calculations have been made for a range of scattering angle θ large enough to indicate the first maximum in I(θ)θ2. According to the Sloan method for determining particle radius, the location of this maximum is inversely proportional to radius, independent of refractive index. The exact calculations show that this is accurate for radii above 10 μm, but for smaller particles the value of the refractive index affects the location to some extent.

© 1973 Optical Society of America

History
Original Manuscript: August 14, 1972
Published: March 1, 1973

Citation
E. J. Meehan and A. E. Gyberg, "Particle-Size Determination by Low-Angle Light Scattering: Effect of Refractive Index," Appl. Opt. 12, 551-554 (1973)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-12-3-551

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