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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 12, Iss. 4 — Apr. 1, 1973
  • pp: 700–709

Confirmation of an Electron Avalanche Causing Laser-induced Bulk Damage at 1.06 μm

D. W. Fradin, Eli Yablonovitch, and Michael Bass  »View Author Affiliations


Applied Optics, Vol. 12, Issue 4, pp. 700-709 (1973)
http://dx.doi.org/10.1364/AO.12.000700


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Abstract

Measurements have been made on intrinsic optical bulk breakdown in ten alkali halides at 1.06 μm and in one at 0.69 μm. By comparing the results to previously reported experiments conducted at 10.6 μm and at direct current, it has been possible to identify the damage mechanism as electron avalanche breakdown. Self-focusing has been controlled by restricting the probe powers to well below the critical powers for catastrophic self-focusing, and damage from inclusions has been distinguished from intrinsic damage. Implications of this work for surface damage studies are explored.

© 1973 Optical Society of America

History
Original Manuscript: September 22, 1972
Published: April 1, 1973

Citation
D. W. Fradin, Eli Yablonovitch, and Michael Bass, "Confirmation of an Electron Avalanche Causing Laser-induced Bulk Damage at 1.06 μm," Appl. Opt. 12, 700-709 (1973)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-12-4-700

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