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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 12, Iss. 7 — Jul. 1, 1973
  • pp: 1496–1505

Pollutant Detection by Absorption Using Mie Scattering and Topographic Targets as Retroreflectors

Robert L. Byer and Max Garbuny  »View Author Affiliations


Applied Optics, Vol. 12, Issue 7, pp. 1496-1505 (1973)
http://dx.doi.org/10.1364/AO.12.001496


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Abstract

Remote pollutant measurement by absorption using topographical reflectors or atmospheric Mie scattering as a distributed reflector offers increased range and sensitivity compared to that achieved by Raman or resonance backscattering methods. The use of topographical reflectors offers the advantage of a single-ended absorption measurement for ranges up to 10 km and sensitivities to less than 0.01 ppm for a 10-mJ, 100-nsec transmitted pulse. The distributed Mie reflector permits absorption measurements over a depth /2, determined by the pulse length τ, and allows ranging by time-of-flight measurement. For a 100-mJ, 100-nsec pulse sensitivities to 0.3 ppm at a 15-m depth resolution to ranges of 1–4 km are possible. This sensitivity is 104 to 105 times better than that achieved by the Raman method.

© 1973 Optical Society of America

History
Original Manuscript: November 13, 1972
Published: July 1, 1973

Citation
Robert L. Byer and Max Garbuny, "Pollutant Detection by Absorption Using Mie Scattering and Topographic Targets as Retroreflectors," Appl. Opt. 12, 1496-1505 (1973)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-12-7-1496


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References

  1. K. Kildal, R. L. Byer, Proc. IEEE 59, 1644 (1971). [CrossRef]
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