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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 12, Iss. 9 — Sep. 1, 1973
  • pp: 2071–2074

Two-Wavelength Interferometry

C. Polhemus  »View Author Affiliations


Applied Optics, Vol. 12, Issue 9, pp. 2071-2074 (1973)
http://dx.doi.org/10.1364/AO.12.002071


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Abstract

Previous methods of two-wavelength variable-sensitivity interferometry are reviewed and a simplified two-wavelength technique for interferometric testing under static conditions is discussed. An extension of the static technique to real-time dynamic testing is proposed and an operational variable-sensitivity interferometer utilizing the real-time technique is described.

© 1973 Optical Society of America

History
Original Manuscript: March 5, 1973
Published: September 1, 1973

Citation
C. Polhemus, "Two-Wavelength Interferometry," Appl. Opt. 12, 2071-2074 (1973)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-12-9-2071


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References

  1. J. C. Wyant, Appl. Opt. 10, 2113 (1971). [CrossRef] [PubMed]
  2. C. Polhemus, C. Chocol, Appl. Opt. 10, 441 (1971). [CrossRef] [PubMed]
  3. S. Yokozeki, T. Suzuki, Appl. Opt. 11, 446 (1972). [CrossRef] [PubMed]
  4. G. Yanow, “CIDRS: Computerized Interferogram Data Reduction Systems,” paper presented at the 1972 spring meeting of the Optical Society of America, April 1972.

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