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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 11 — Nov. 1, 1974
  • pp: 2689–2692

Envelope Interferometry for Large-Scale Processing

Albert Macovski  »View Author Affiliations


Applied Optics, Vol. 13, Issue 11, pp. 2689-2692 (1974)
http://dx.doi.org/10.1364/AO.13.002689


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Abstract

An interferometry system is presented that is useful in large-scale measurements such as those of topographic maps. The envelope of a propagating wave is used to create the desired fringe patterns, representing range contours, through the interference of a light modulation function and an image modulation function. A number of variations are shown that either provide altitude contours or place the contour information on a spatial frequency carrier. This latter system offers the flexibility of electronic processing when the image is scanned. The comparison of contour patterns taken at different times provides an accurate indication of subtle surface deformations.

© 1974 Optical Society of America

History
Original Manuscript: April 12, 1974
Published: November 1, 1974

Citation
Albert Macovski, "Envelope Interferometry for Large-Scale Processing," Appl. Opt. 13, 2689-2692 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-11-2689

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