This paper is a theoretical presentation of a two wavelength holographic method of measuring the roughness of a surface. This method extends the range of surface roughness which can be measured to arbitrarily rough surfaces. This paper also discusses the factors that limit the accuracy of the proposed method.
© 1974 Optical Society of America
Original Manuscript: July 11, 1973
Published: May 1, 1974
William B. Ribbens, "Surface Roughness Measurement by Two Wavelength Holographic Interferometry," Appl. Opt. 13, 1085-1088 (1974)