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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1085–1088

Surface Roughness Measurement by Two Wavelength Holographic Interferometry

William B. Ribbens  »View Author Affiliations


Applied Optics, Vol. 13, Issue 5, pp. 1085-1088 (1974)
http://dx.doi.org/10.1364/AO.13.001085


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Abstract

This paper is a theoretical presentation of a two wavelength holographic method of measuring the roughness of a surface. This method extends the range of surface roughness which can be measured to arbitrarily rough surfaces. This paper also discusses the factors that limit the accuracy of the proposed method.

© 1974 Optical Society of America

History
Original Manuscript: July 11, 1973
Published: May 1, 1974

Citation
William B. Ribbens, "Surface Roughness Measurement by Two Wavelength Holographic Interferometry," Appl. Opt. 13, 1085-1088 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1085

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