Surface Roughness Measurement by Two Wavelength Holographic Interferometry
Applied Optics, Vol. 13, Issue 5, pp. 1085-1088 (1974)
http://dx.doi.org/10.1364/AO.13.001085
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Abstract
This paper is a theoretical presentation of a two wavelength holographic method of measuring the roughness of a surface. This method extends the range of surface roughness which can be measured to arbitrarily rough surfaces. This paper also discusses the factors that limit the accuracy of the proposed method.
Citation
William B. Ribbens, "Surface Roughness Measurement by Two Wavelength Holographic Interferometry," Appl. Opt. 13, 1085-1088 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1085
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