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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1085–1088

Surface Roughness Measurement by Two Wavelength Holographic Interferometry

William B. Ribbens  »View Author Affiliations


Applied Optics, Vol. 13, Issue 5, pp. 1085-1088 (1974)
http://dx.doi.org/10.1364/AO.13.001085


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Abstract

This paper is a theoretical presentation of a two wavelength holographic method of measuring the roughness of a surface. This method extends the range of surface roughness which can be measured to arbitrarily rough surfaces. This paper also discusses the factors that limit the accuracy of the proposed method.

© 1974 Optical Society of America

History
Original Manuscript: July 11, 1973
Published: May 1, 1974

Citation
William B. Ribbens, "Surface Roughness Measurement by Two Wavelength Holographic Interferometry," Appl. Opt. 13, 1085-1088 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1085


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References

  1. W. B. Ribbens, Appl. Opt. 11, 807 (1972). [CrossRef] [PubMed]
  2. B. P. Hildebrand, K. A. Haines, J. Opt. Soc. Am. 57, 155 (1967). [CrossRef]
  3. J. Zalenka, J. Varner, Appl. Opt. 8, 1431(1969). [CrossRef]
  4. J. R. Varner, “Multiple-Frequence Holographic Contouring,” Ph.D. Thesis, Electrical Engineering, The University of Michigan (1971).
  5. G. L. Lazik, “The Application of Coherent Fourier Optics to Physical Surface Analysis,” Ph.D. Thesis, Electrical Engineering, The University of Michigan (1970).

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