OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1089–1092

Pattern Comparison by Interference Fringe Scanning

Tadao Tsuruta, Yoshinobu Itoh, and Hiroshi Shirasu  »View Author Affiliations

Applied Optics, Vol. 13, Issue 5, pp. 1089-1092 (1974)

View Full Text Article

Enhanced HTML    Acrobat PDF (404 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



An apparatus for real-time pattern comparison based on the interference method proposed by Weinberger and Almi is described. Particular emphasis is stressed on its use in fingerprint identification. Preliminary experiments confirmed that the apparatus is feasible for the purpose.

© 1974 Optical Society of America

Original Manuscript: August 17, 1973
Published: May 1, 1974

Tadao Tsuruta, Yoshinobu Itoh, and Hiroshi Shirasu, "Pattern Comparison by Interference Fringe Scanning," Appl. Opt. 13, 1089-1092 (1974)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. H. Weinberger, U. Almi, Appl. Opt. 10, 2482 (1971). [CrossRef] [PubMed]
  2. A referee suggested that a similar method was described by J. F. Rau in U.S. Patent3,519,992 (1970).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3
Fig. 4 Fig. 5

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited