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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1089–1092

Pattern Comparison by Interference Fringe Scanning

Tadao Tsuruta, Yoshinobu Itoh, and Hiroshi Shirasu  »View Author Affiliations


Applied Optics, Vol. 13, Issue 5, pp. 1089-1092 (1974)
http://dx.doi.org/10.1364/AO.13.001089


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Abstract

An apparatus for real-time pattern comparison based on the interference method proposed by Weinberger and Almi is described. Particular emphasis is stressed on its use in fingerprint identification. Preliminary experiments confirmed that the apparatus is feasible for the purpose.

© 1974 Optical Society of America

History
Original Manuscript: August 17, 1973
Published: May 1, 1974

Citation
Tadao Tsuruta, Yoshinobu Itoh, and Hiroshi Shirasu, "Pattern Comparison by Interference Fringe Scanning," Appl. Opt. 13, 1089-1092 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1089


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References

  1. H. Weinberger, U. Almi, Appl. Opt. 10, 2482 (1971). [CrossRef] [PubMed]
  2. A referee suggested that a similar method was described by J. F. Rau in U.S. Patent3,519,992 (1970).

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